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Optical Characterization of Si-Based Ge1−x Sn x Alloys with Sn Compositions up to 12

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Bibliographic Details
Published in:Journal of electronic materials 2016-04, Vol.45 (4), p.2133-2141
Main Authors: Al-Kabi, Sattar, Ghetmiri, Seyed Amir, Margetis, Joe, Du, Wei, Mosleh, Aboozar, Alher, Murtadha, Dou, Wei, Grant, Joshua M., Sun, Greg, Soref, Richard A., Tolle, John, Li, Baohua, Mortazavi, Mansour, Naseem, Hameed A., Yu, Shui-Qing
Format: Article
Language:English
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ISSN:0361-5235
1543-186X
DOI:10.1007/s11664-015-4283-6