Automated compositional control of Hg1−xCdxTe during MBE, using in situ spectroscopic ellipsometry

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Bibliographic Details
Published in:Journal of electronic materials 1998-06, Vol.27 (6), p.500-503
Main Authors: Almeida, L. A., Johnson, J. N., Benson, J. D., Dinan, J. H., Johs, B.
Format: Article
Language:English
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ISSN:0361-5235
1543-186X
DOI:10.1007/s11664-998-0004-8