Effect of electrochemical etching current on prepared perforated silicon structures for neutron detectors

Neutron detector based on perforated silicon structures backfilled with neutron converting materials could be operated at a low voltage and improves the detection efficiency of thermal neutron. It is found that the intrinsic detection efficiency of thermal neutron is affected by a lot of factors suc...

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Bibliographic Details
Published in:Frontiers of materials science 2013-03, Vol.7 (1), p.96-101
Main Authors: Fan, Xiao-Qiang, Jiang, Yong, Zhan, Chang-Yong, Zou, Yu, Wu, Jian-Chun, Huang, Ning-Kang
Format: Article
Language:English
Subjects:
Chemistry and Materials Science
Communication
current
detector
electrochemical
etching
Materials Science
neutron
silicon
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Summary:Neutron detector based on perforated silicon structures backfilled with neutron converting materials could be operated at a low voltage and improves the detection efficiency of thermal neutron. It is found that the intrinsic detection efficiency of thermal neutron is affected by a lot of factors such as the geometry, size, and depth of the perforation and so on. In this study, the perforated silicon was prepared by electrochemical etching. Effect of etching current on geometry, size, and depth of the perforated silicon structures for neutron detectors was also reported.
ISSN:2095-025X
2095-0268
DOI:10.1007/s11706-013-0197-5