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Fault diagnosis and process monitoring using a statistical pattern framework based on a self-organizing map
A multivariate method for fault diagnosis and process monitoring is proposed. This technique is based on a statistical pattern (SP) framework integrated with a self-organizing map (SOM). An SP-based SOM is used as a classifier to distinguish various states on the output map, which can visually monit...
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Published in: | Journal of Central South University 2015-02, Vol.22 (2), p.601-609 |
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Main Authors: | , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | A multivariate method for fault diagnosis and process monitoring is proposed. This technique is based on a statistical pattern (SP) framework integrated with a self-organizing map (SOM). An SP-based SOM is used as a classifier to distinguish various states on the output map, which can visually monitor abnormal states. A case study of the Tennessee Eastman (TE) process is presented to demonstrate the fault diagnosis and process monitoring performance of the proposed method. Results show that the SP-based SOM method is a visual tool for real-time monitoring and fault diagnosis that can be used in complex chemical processes. Compared with other SOM-based methods, the proposed method can more efficiently monitor and diagnose faults. |
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ISSN: | 2095-2899 2227-5223 |
DOI: | 10.1007/s11771-015-2561-3 |