Correction: Rapid Thermal Annealing Under O2 Ambient to Recover the Deterioration by Gamma-Ray Irradiation in a-IGZO TFTs

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Bibliographic Details
Published in:Electronic materials letters 2025-01
Main Authors: Park, Minah, Yoo, Jaewook, Lee, Hongseung, Song, Hyeonjun, Kim, Soyeon, Lim, Seongbin, Park, Seohyeon, Jeong, Jo Hak, Kim, Bongjoong, Lee, Kiyoung, Lee, Yoon Kyeung, Heo, Keun, Kwon, Jiseok, Bae, Hagyoul
Format: Article
Language:English
Online Access:Get full text
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ISSN:1738-8090
2093-6788
DOI:10.1007/s13391-024-00536-6