A method for determining the microstructural changes in graphite that accompany high temperature deformation

Sequential optical and electron photomicrographs were made on the same areas of graphite specimens before and after various amounts of creep strain at 2500°C. The polished and etched surfaces of the specimen were preserved by wrapping several layers of pyrocarbon tape over the gage length, by outgas...

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Bibliographic Details
Published in:Carbon (New York) 1967-01, Vol.5 (6), p.583,IN15,585-584,IN22,586
Main Authors: Green, W.V., Levinson, L.S., Reiswig, R.D., Zukas, E.G.
Format: Article
Language:English
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Summary:Sequential optical and electron photomicrographs were made on the same areas of graphite specimens before and after various amounts of creep strain at 2500°C. The polished and etched surfaces of the specimen were preserved by wrapping several layers of pyrocarbon tape over the gage length, by outgassing at temperatures below 2000°C in a vacuum of less than 5 × 10 −5 torr, and by using spectrograde argon when heating to temperatures above 2000°C. The strains for ZTA samples whose stress axes were parallel, or nearly parallel, to the average c-axis were caused principally by crack formation and growth.
ISSN:0008-6223
1873-3891
DOI:10.1016/0008-6223(67)90037-1