Photoelectron intensity spectroscopy  analytical and structural information from peis applied to zeolites

X-ray photoelectron spectroscopy (XPS or ESCA) based on calculated photoionization cross sections was used to investigate the surface Si/Al ratio of different zeolites and the cation distribution in Ag- and Ca-exchanged NaA-zeolites. We find the same module at the surface as in the bulk, but a stron...

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Bibliographic Details
Published in:Chemical physics letters 1977-09, Vol.50 (2), p.223-227
Main Authors: Finster, J., Lorenz, Petra
Format: Article
Language:English
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Summary:X-ray photoelectron spectroscopy (XPS or ESCA) based on calculated photoionization cross sections was used to investigate the surface Si/Al ratio of different zeolites and the cation distribution in Ag- and Ca-exchanged NaA-zeolites. We find the same module at the surface as in the bulk, but a strong de-alumination of the surface after HCl treatment. The Ag + ions are enriched and the Na + ions depleted in the outer cavities of the zeolite crystals, both in strong dependence on the Ca content.
ISSN:0009-2614
1873-4448
DOI:10.1016/0009-2614(77)80168-1