Thickness dependence of photoconductivity in tellurium

Photoconductive infrared response has been investigated in bulk monocrystalline and thin film polycrystalline undoped tellurium samples at 77K at wavelengths between about 1 and 4.5μm. Thickness dependence of the response has been specifically investigated and found to be consistent with the calcula...

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Bibliographic Details
Published in:Infrared physics 1981, Vol.21 (1), p.45-52
Main Authors: Shyamprasad, N.G., Champness, C.H., Shih, I.
Format: Article
Language:English
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Summary:Photoconductive infrared response has been investigated in bulk monocrystalline and thin film polycrystalline undoped tellurium samples at 77K at wavelengths between about 1 and 4.5μm. Thickness dependence of the response has been specifically investigated and found to be consistent with the calculated results.
ISSN:0020-0891
DOI:10.1016/0020-0891(81)90009-9