Ion microprobe trace element analysis with high mass resolution

If high mass resolution is used to separate interfering peaks in ion microprobe spectra the sacrifice in intensity with increasing resolution is critical, especially for trace elements. The intensity/resolution curve for the AEI IM-20 instrument has been determined. Compared with the lowest resoluti...

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Bibliographic Details
Published in:International journal of mass spectrometry and ion physics 1976-01, Vol.22 (3), p.333-338
Main Authors: Reed, S.J.B., Long, J.V.P., Coles, J.N., Astill, D.M.
Format: Article
Language:English
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Summary:If high mass resolution is used to separate interfering peaks in ion microprobe spectra the sacrifice in intensity with increasing resolution is critical, especially for trace elements. The intensity/resolution curve for the AEI IM-20 instrument has been determined. Compared with the lowest resolution, the intensity at 3000 resolution (10% valley) is reduced by a factor of ca. 10. The shape of the plot of mass defect against atomic mass determines whether a particular interference can be resolved. In many, but not all, cases a resolution of 3000 is sufficient. Results of analysing Cr-doped diopside glasses for Cr (10–3000 p.p.m.) are given as an example of the application of high mass resolution ( 26Mg 2 interferes with 52Cr at low resolution). Measurements showing the possibility of suppressing molecular relative to monatomic peaks are also described.
ISSN:0020-7381
1873-3034
DOI:10.1016/0020-7381(76)80093-9