Simultaneous observation of first and second field free region metastable transitions in a double-focusing mass spectrometer of reversed Nier-Johnson geometry

The presence of an unexpected and interfering metastable signal has been detected during the application of a double-focusing reversed-geometry mass spectrometer in the accelerating-voltage scan mode of metastable analysis. The signal has been attributed to the decomposition of voltage-focused main...

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Bibliographic Details
Published in:International journal of mass spectrometry and ion physics 1976, Vol.22 (3), p.359-364
Main Authors: Ligon, W.V., Webb, J.L.
Format: Article
Language:English
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Summary:The presence of an unexpected and interfering metastable signal has been detected during the application of a double-focusing reversed-geometry mass spectrometer in the accelerating-voltage scan mode of metastable analysis. The signal has been attributed to the decomposition of voltage-focused main beam ions in the second field free region. A detailed analysis of the origin of this signal and methods for its identification are provided.
ISSN:0020-7381
1873-3034
DOI:10.1016/0020-7381(76)80095-2