Critical layer thickness of MOVPE-grown GaAs on InxGa1−xAs

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Bibliographic Details
Published in:Journal of crystal growth 1991-01, Vol.107 (1-4), p.496-501
Main Authors: te Nijenhuis, J., van der Wel, P.J., van Asten, R.W.F., Hageman, P.R., Giling, L.J.
Format: Article
Language:English
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ISSN:0022-0248
DOI:10.1016/0022-0248(91)90510-C