Molecular imaging of epitaxially grown organic double-layer

Molecular imaging by high resolution electron microscopy was applied to observation of an interface of organic double-layered thin films grown epitaxially by vacuum deposition. In the case of the interface between Ge-O-phthalocyanine (GeOPc) and Cl-tetraphenylporphinate-Fe (ClTPPFe), electron diffra...

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Bibliographic Details
Published in:Journal of crystal growth 1991-12, Vol.115 (1), p.388-392
Main Authors: Isoda, Seiji, Kubo, Itaru, Hoshino, Akitaka, Asaka, Noriko, Kurata, Hiroki, Kobayashi, Takashi
Format: Article
Language:English
Subjects:
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Physics
Solid surfaces and solid-solid interfaces
Surface and interface dynamics and vibrations
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Thin film structure and morphology
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Summary:Molecular imaging by high resolution electron microscopy was applied to observation of an interface of organic double-layered thin films grown epitaxially by vacuum deposition. In the case of the interface between Ge-O-phthalocyanine (GeOPc) and Cl-tetraphenylporphinate-Fe (ClTPPFe), electron diffraction showed that the tetragonal ClTPPFe crystals grew epitaxially on the tetragonal GeOPc substrate crystals keeping the a- and c-axes parallel to those of GeOPc, respectively. A plane view projection of the double-layer by high resolution imaging has revealed that the ClTPPFe crystal began to crystallize from a point shifted about one fourth of the unit cell length along [110] of the GeOPc crystal.
ISSN:0022-0248
1873-5002
DOI:10.1016/0022-0248(91)90773-X