Detection of sulphur and polysulphides on electrochemically oxidized pyrite surfaces by X-ray photoelectron spectroscopy and Raman spectroscopy

The electrochemical oxidation of pyrite surfaces in near-neutral aqueous chloride solutions has been investigated using X-ray photoelectron spectroscopy (XPS), scanning electron microscopy/energy dispersive X-ray analysis (SEM/EDXA) and Raman spectroscopy in conjunction with electrochemical techniqu...

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Bibliographic Details
Published in:Journal of electroanalytical chemistry and interfacial electrochemistry 1990-10, Vol.292 (1), p.139-152
Main Authors: Mycroft, J.R., Bancroft, G.M., McIntyre, N.S., Lorimer, J.W., Hill, I.R.
Format: Article
Language:English
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Summary:The electrochemical oxidation of pyrite surfaces in near-neutral aqueous chloride solutions has been investigated using X-ray photoelectron spectroscopy (XPS), scanning electron microscopy/energy dispersive X-ray analysis (SEM/EDXA) and Raman spectroscopy in conjunction with electrochemical techniques. The surface oxidation products of pyrite, between 600 and 700 mV (SCE), have been identified by Raman spectroscopy as polysulphides and elemental sulphur.
ISSN:0022-0728
DOI:10.1016/0022-0728(90)87332-E