Effects of Mn effusion cell temperature on the film properties and on the AC electroluminescence of molecular beam deposited ZnS:Mn

• Published in: Journal of luminescence 1990-08, Vol.47 (1), p.41-47
• Main Authors: Ohta, Shin-ichi, Tadokoro, Toyoyasu, Satou, Shuji, Kobayashi, Satoshi, Kaneko, Futao
• Format: Article
• Language: English
• Subjects: Condensed matter: electronic structure, electrical, magnetic, and optical properties; Exact sciences and technology; Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation; Optical properties of specific thin films; Physics
• ISSN: 0022-2313; 1872-7883
• DOI: 10.1016/0022-2313(90)90057-I

The AC thin-film electroluminescent (ACTFEL) devices were prepared by using 1 μm-thick ZnS:Mn luminescent layers formed by molecular beam deposition (MBD). The devices had a structure of glass/In 2O 3/barium-titanate/ZnS:Mn/Al. The EL properties of the device are remarkably dependent on the temperature of a Mn effusion cell ( T Mn) during the ZnS:Mn deposition. Although the crystalline quality of the layers was poor and the surface morphology was rough, a low threshold field ( E th) of 0.82×10 6 V/cm, and a high maximum luminance ( L max) of 4200 cd/m 2 were obtained at 5 kHz sinusoidal operation. The ACEL properties were dependent not only on the crystallographic quality but also on the Mn concentration in the luminescent layer.