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Electrical properties of amorphous films of TeTl alloys
Amorphous films of TeTl alloys have been prepared with compositions in the range 20–70% Tl either by co-evaporation of the constituent elements or by a modification of the flash evaporation method. Measurements were made of the conductivity as a function of both composition and temperature. The cond...
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Published in: | Journal of non-crystalline solids 1972, Vol.8, p.798-803 |
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Main Authors: | , , |
Format: | Article |
Language: | English |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Amorphous films of TeTl alloys have been prepared with compositions in the range 20–70% Tl either by co-evaporation of the constituent elements or by a modification of the flash evaporation method. Measurements were made of the conductivity as a function of both composition and temperature. The conductivity of the as-deposited alloys plotted as a function of composition shows minima at Tl
2Te
n
(
n = 1–7) and at Tl
3Te
2 and Tl
5Te
3; at each of these compositions there is a maximum in the activation energy versus composition plot. A band structure model that could explain the electrical properties of these films is given. |
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ISSN: | 0022-3093 1873-4812 |
DOI: | 10.1016/0022-3093(72)90230-X |