Excited atom as a gauge for calibration of the voids in rigid networks

The D-line emission from excited Na atoms penetrating the interior of a glass was observed. This fact can be clarified under assumption that the voids in the SiO 2 network are sufficiently large to contain the 3p orbital of the excited Na atom. Thus, the excited atoms can be used as a gauge for the...

Full description

Saved in:
Bibliographic Details
Published in:Journal of non-crystalline solids 1984-01, Vol.64 (1), p.211-214
Main Authors: Dziurda, W, Gabła, L, Tuleta, M
Format: Article
Language:English
Subjects:
Applied sciences
Building materials. Ceramics. Glasses
Chemical industry and chemicals
Exact sciences and technology
Glasses
Structure, analysis, properties
Citations: Items that this one cites
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The D-line emission from excited Na atoms penetrating the interior of a glass was observed. This fact can be clarified under assumption that the voids in the SiO 2 network are sufficiently large to contain the 3p orbital of the excited Na atom. Thus, the excited atoms can be used as a gauge for the calibration of voids inside transparent condensed matter.
ISSN:0022-3093
1873-4812
DOI:10.1016/0022-3093(84)90217-5