Nitrogen-associated paramagnetic defect centers in sputtered SiO2 films

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Bibliographic Details
Published in:Journal of non-crystalline solids 1985-01, Vol.71 (1-3), p.351-359
Main Authors: Friebele, E.J., Griscom, D.L., Hickmott, T.W.
Format: Article
Language:English
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ISSN:0022-3093
DOI:10.1016/0022-3093(85)90306-0