Structure of liquid II–IV compounds: CdTe

The structure factor of CdTe is studied by neutron diffraction just above its melting point (1100°C). Short wavelength neutrons (λ = 0.35 A ̊ ) have been used in order to avoid the strong absorption of Cd around λ = 0.7 A ̊ . The structure factor and the pair correlation function differ substantiall...

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Bibliographic Details
Published in:Journal of non-crystalline solids 1987-12, Vol.97, p.1283-1286
Main Authors: Gaspard, J.P., Bergman, C., Bichara, C., Bellissent, R., Chieux, P., Goffart, J.
Format: Article
Language:English
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Summary:The structure factor of CdTe is studied by neutron diffraction just above its melting point (1100°C). Short wavelength neutrons (λ = 0.35 A ̊ ) have been used in order to avoid the strong absorption of Cd around λ = 0.7 A ̊ . The structure factor and the pair correlation function differ substantially from those of group IV semiconductors (Si, Ge) or III–V compounds (GaAs, InSb) in the liquid state. The first peak of the pair correlation function coincides with the nearest neighbour distance in crystalline CdTe and the coordination number lies between 3 and 4. We suggest that the structure of liquid CdTe is similar to the structure of the continuous random network (Polk or Connell-Temkin model). This is consistant with the increase of the electrical resistivity with temperature.
ISSN:0022-3093
1873-4812
DOI:10.1016/0022-3093(87)90307-3