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Silicon deposition on stainless steel surfaces in view of the conditioning of FTU vacuum chamber
The properties of silicon films deposited on stainless steel surfaces held at 77 K, which is approximately the FTU (Frascati Tokamak Upgrade) wall temperature, have been investigated for the first time. Bad adherence and traces of peeling resulted, using the same experimental conditions foreseen for...
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Published in: | Journal of nuclear materials 1994-09, Vol.212, p.1541-1545 |
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Main Authors: | , , , |
Format: | Article |
Language: | English |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | The properties of silicon films deposited on stainless steel surfaces held at 77 K, which is approximately the FTU (Frascati Tokamak Upgrade) wall temperature, have been investigated for the first time.
Bad adherence and traces of peeling resulted, using the same experimental conditions foreseen for the machine: silane concentration in helium equal to 0.11–0.13, current density in the range 40–150 mA/m
2. On the contrary, good results were obtained on substrates held at 273 K. This temperature represents a reasonable compromise for FTU operations. |
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ISSN: | 0022-3115 1873-4820 |
DOI: | 10.1016/0022-3115(94)91086-3 |