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X-ray photoelectron spectroscopy characterization of hydrated palladium(II) oxide species used in catalysis
Palladium oxide systems, both pure and supported on various substrates such as alumina, zinc oxide, silica and titania, are of interest because of both their semiconducting behaviour and their catalytic activity, and they have been the subject of a number of X-ray photoelectron spectroscopy (XPS) in...
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Published in: | Journal of the less-common metals 1984-01, Vol.102 (1), p.89-96 |
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Main Authors: | , , |
Format: | Article |
Language: | English |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Palladium oxide systems, both pure and supported on various substrates such as alumina, zinc oxide, silica and titania, are of interest because of both their semiconducting behaviour and their catalytic activity, and they have been the subject of a number of X-ray photoelectron spectroscopy (XPS) investigations. The XPS technique is used here to investigate properties of various hydrated
PdO ·
nH
2
O systems prepared both by a single impregnation method on various supports and by various impregnation treatments on the same support. XPS data for supported palladium oxide show that the intensity of interaction with the support is very weak, if indeed it exists. The processes occurring during the impregnation of the supports by the precursors are discussed; the nature of the species obtained depends on the activity of the support. |
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ISSN: | 0022-5088 |
DOI: | 10.1016/0022-5088(84)90391-6 |