Concentration profiles of passive films formed on niobium metal and niobium-base alloys by auger electron spectrometry

Concentration profiles of passive films formed on electrolytically anodized niobium and niobium-base alloys are obtained by Auger Electron Spectroscopy with simultaneous ion beam etching. The alloys investigated include 5Zr-Nb, 3Zr-10Ti-Nb, 2.5Zr-2W-Nb and 1Zr-5Mo-5V-Nb. Experiments demonstrate that...

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Bibliographic Details
Published in:Materials research bulletin 1976-05, Vol.11 (5), p.517-524
Main Authors: Romand, M., Solomon, J.S., Baun, W.L.
Format: Article
Language:English
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Summary:Concentration profiles of passive films formed on electrolytically anodized niobium and niobium-base alloys are obtained by Auger Electron Spectroscopy with simultaneous ion beam etching. The alloys investigated include 5Zr-Nb, 3Zr-10Ti-Nb, 2.5Zr-2W-Nb and 1Zr-5Mo-5V-Nb. Experiments demonstrate that AES is among the most fascinating techniques for solving various characterization problems related to the structure and composition of the thin films formed by anodization. Data presented supports evidence that combined anodic and cathodic movements take place during film growth.
ISSN:0025-5408
1873-4227
DOI:10.1016/0025-5408(76)90233-6