Dielectric relaxation in p-terphenyl crystals

The low frequency dielectric properties of p-terphenyl crystals and polycrystalline layers are presented. The relaxation loss peak is ascribed to a trapping level 1.04 × 10 −19 J (0.65 eV) deep. The results are interpreted by means of the many-body Dissado-Hill theory of dielectric response in solid...

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Bibliographic Details
Published in:Materials science and engineering 1986, Vol.80 (2), p.L37-L39
Main Author: Bak, G.W.
Format: Article
Language:English
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Summary:The low frequency dielectric properties of p-terphenyl crystals and polycrystalline layers are presented. The relaxation loss peak is ascribed to a trapping level 1.04 × 10 −19 J (0.65 eV) deep. The results are interpreted by means of the many-body Dissado-Hill theory of dielectric response in solids.
ISSN:0025-5416
DOI:10.1016/0025-5416(86)90210-7