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Electrooptic properties of a ferroelectric polymer studied by attenuated total reflection

The attenuated total reflection method is used for measuring the electrooptic properties of a thin film of a polarized ferroelectric polymer. The piezoelectric character of the sample is shown to be of major importance. A very simple theory is presented which explains an unexpected change of sign of...

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Bibliographic Details
Published in:Optics communications 1989-01, Vol.69 (5), p.379-383
Main Authors: Dentan, V., Lévy, Y., Dumont, M., Robin, P., Chastaing, E.
Format: Article
Language:English
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Summary:The attenuated total reflection method is used for measuring the electrooptic properties of a thin film of a polarized ferroelectric polymer. The piezoelectric character of the sample is shown to be of major importance. A very simple theory is presented which explains an unexpected change of sign of the electrooptic signal. A method is given for extracting the molecular electrooptic coefficients.
ISSN:0030-4018
1873-0310
DOI:10.1016/0030-4018(89)90023-0