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Electrooptic properties of a ferroelectric polymer studied by attenuated total reflection
The attenuated total reflection method is used for measuring the electrooptic properties of a thin film of a polarized ferroelectric polymer. The piezoelectric character of the sample is shown to be of major importance. A very simple theory is presented which explains an unexpected change of sign of...
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Published in: | Optics communications 1989-01, Vol.69 (5), p.379-383 |
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Main Authors: | , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | The attenuated total reflection method is used for measuring the electrooptic properties of a thin film of a polarized ferroelectric polymer. The piezoelectric character of the sample is shown to be of major importance. A very simple theory is presented which explains an unexpected change of sign of the electrooptic signal. A method is given for extracting the molecular electrooptic coefficients. |
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ISSN: | 0030-4018 1873-0310 |
DOI: | 10.1016/0030-4018(89)90023-0 |