Thickness dependence of the transition temperature of superconducting films

A linear dependence of transition temperature on reciprocal film thickness was observed for “amorphous” films of Bi, Ga, Al, and for Pb containing 18 at. % Bi. Thinner films had lower transition temperatures than thick ones This holds for thicknesses above a critical value on the order of a few hund...

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Bibliographic Details
Published in:Physica 1971, Vol.55, p.250-255
Main Authors: Naugle, D.G., Glover, R.E., Moormann, W.
Format: Article
Language:English
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Summary:A linear dependence of transition temperature on reciprocal film thickness was observed for “amorphous” films of Bi, Ga, Al, and for Pb containing 18 at. % Bi. Thinner films had lower transition temperatures than thick ones This holds for thicknesses above a critical value on the order of a few hundred Å which was different for the different materials. Measurements extended up to several thousand Å. The decrease in transition temperature could equally well be described as being proportional to the residual resistance per square for films of a given composition. The transition temperature of crystalline Pb-Bi films decreased with decreasing thickness did not show the linear behavior observed for the amorphous materials.
ISSN:0031-8914
DOI:10.1016/0031-8914(71)90258-8