A method for quantitative determination of defects in polymer layers by X-ray microanalysis and scanning electron microscopy

• Published in: Polymer science USSR 1991, Vol.33 (8), p.1677-1685
• Main Authors: Sapozhnikova, I.N., Chalykh, A.Ye
• Format: Article
• Language: English
• ISSN: 0032-3950; 1878-268X
• DOI: 10.1016/0032-3950(91)90057-W

A universal, rapid and based on scanning electron microscopy and X-ray microanalysis has been developed for determining quantitatively the defectiveness of polymeric surface coatings. The method makes use of the fact that defects, regardless of their type (concentration fluctuations, dispersed inclusions, form defects, etc.) can be considered as compositional defects, each in its own scale, and can be evaluated from the induced change in intensity of a characteristic X-ray radiation of defects containing a surface element as compared to an element without defects. Two alternatives are proposed for evaluating the defects—either from their total number ( D s ) or according to defect type ( D l ). The quantity D s can be estimated by measuring the intensity of X-ray radiation in different scales: by varying the magnification in the scanning electron microscopy of the defect-containing surface area and, on the other hand, at the “point” of a defectless surface. The parameter D l is determined by comparing the intensities of X-ray radiation from the respective “points” in the defective and defectless areas of the investigated surface. The method was checked on heterogeneous, layered filled systems similar to those used in the magnetic hard disks. The results enabled us to devise defectograms of ferromagnetic layers of magnetic memory devices (disks). By using the defects as a negative property we were able to deduce a generalized dependence property-composition.