Anisotropic dielectric constant of TTF-TCNQ observed by dielectric resonance

Independent measurements at low temperatures of the anisotropic dielectric constant (∈ 1) of TTF-TCNQ are reported. The measurements utilize dielectric resonance techniques to determine ∈ B 1 and ∈ a 1 on the same crystal. The results confirm the unusually large value for ∈ b 1(4.2 K) > 10 3 and...

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Bibliographic Details
Published in:Solid state communications 1975-03, Vol.16 (5), p.667-670
Main Authors: Khanna, S.K., Garito, A.F., Heeger, A.J., Jaklevic, R.C.
Format: Article
Language:English
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Summary:Independent measurements at low temperatures of the anisotropic dielectric constant (∈ 1) of TTF-TCNQ are reported. The measurements utilize dielectric resonance techniques to determine ∈ B 1 and ∈ a 1 on the same crystal. The results confirm the unusually large value for ∈ b 1(4.2 K) > 10 3 and the anisotropic behavior ∈ b 1(4.2 K) > 10 2 found earlier in cavity perturbation studies of TTF-TCNQ.
ISSN:0038-1098
1879-2766
DOI:10.1016/0038-1098(75)90448-2