The composition dependence of the gap in amorphous films of SixGe1−x, SbxSe1−x and AsxTe1−x systems

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Bibliographic Details
Published in:Solid state communications 1982-01, Vol.41 (10), p.751-754
Main Authors: Tichý, L., Tříska, A., Tichà, H., Frumar, M., Klikorka, J.
Format: Article
Language:English
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ISSN:0038-1098
DOI:10.1016/0038-1098(82)91131-0