Crystallite size determination in μc-Ge films by x-ray diffraction and Raman line profile analysis

Experimental Raman spectra were used to evaluate the average crystallite size of μc-Ge films. The experimental curves were fitted with a theoretical expression obtained by Richter et al. assuming a Gaussian size distribution. X-ray Diffraction line profile analysis was performed to obtain crystallit...

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Bibliographic Details
Published in:Solid state communications 1993, Vol.85 (4), p.307-310
Main Authors: dos Santos, D.R., Torriani, I.L.
Format: Article
Language:English
Subjects:
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Physics
Solid surfaces and solid-solid interfaces
Surface and interface dynamics and vibrations
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Thin film structure and morphology
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Summary:Experimental Raman spectra were used to evaluate the average crystallite size of μc-Ge films. The experimental curves were fitted with a theoretical expression obtained by Richter et al. assuming a Gaussian size distribution. X-ray Diffraction line profile analysis was performed to obtain crystallite size and shape information. Comparison of the results from both techniques proves that the crystallite dimensions obtained can only be expected to be similar in those cases in which the approximation of “spherical” grains is valid.
ISSN:0038-1098
1879-2766
DOI:10.1016/0038-1098(93)90021-E