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Measurement of diffusion profile of Zn in n-type GaAs by a spreading resistance technique

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Bibliographic Details
Published in:Solid-state electronics 1967-01, Vol.10 (7), p.727-728
Main Authors: Frank, H., Azim, Samy Abdel
Format: Article
Language:English
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ISSN:0038-1101
1879-2405
DOI:10.1016/0038-1101(67)90101-3