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Nonlinearity in hall devices and its compensation
Three types of nonlinearity effects can be distinguished in Hall devices: material, geometrical and junction field-effect nonlinearity. Material nonlinearity, a magnetic field dependence of the Hall coefficient, is experimentally characterized for n-type silicon as a function of carrier concentratio...
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Published in: | Solid-state electronics 1988-12, Vol.31 (12), p.1681-1688 |
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Main Authors: | , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Three types of nonlinearity effects can be distinguished in Hall devices: material, geometrical and junction field-effect nonlinearity. Material nonlinearity, a magnetic field dependence of the Hall coefficient, is experimentally characterized for
n-type silicon as a function of carrier concentration and temperature. Geometrical nonlinearity, which is due to the short-circuiting effects by the sensor contacts, is related to the geometrical correction factor. It is shown that material and geometrical non-linearity can mutually cancel. Junction field-effect nonlinearity comes about as a modulation of the plate thickness in junction-isolated, integrated Hall devices. The junction field-effect can also be used to compensate nonlinearity. |
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ISSN: | 0038-1101 1879-2405 |
DOI: | 10.1016/0038-1101(88)90064-0 |