Implementation of heterojunctions into the 2-D finite-element simulator prism: Some scaling considerations

In this paper a very efficient way to obtain a unified scaling system while implementing heterojunctions in a 2-D finite-element device simulator is discussed. A real device is simulated using the technique described. It is shown that discrepancies between the simulation and the measurement can be e...

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Bibliographic Details
Published in:Solid-state electronics 1992-04, Vol.35 (4), p.571-578
Main Authors: Vankemmel, R., Schoenmaker, W., Cartuyvels, R., Appeltans, K., De Meyer, K.
Format: Article
Language:English
Subjects:
Applied sciences
Electronics
Exact sciences and technology
Microelectronic fabrication (materials and surfaces technology)
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
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Summary:In this paper a very efficient way to obtain a unified scaling system while implementing heterojunctions in a 2-D finite-element device simulator is discussed. A real device is simulated using the technique described. It is shown that discrepancies between the simulation and the measurement can be explained by the inaccuracy of the available models and material parameters.
ISSN:0038-1101
1879-2405
DOI:10.1016/0038-1101(92)90122-S