The elastic scattering effect on transmitted and reflected Al thin film Auger yields

We have studied, using a Monte Carlo simulation code, the effect of elastic scattering on reflected and transmitted Al thin film Auger yields. We found that the behaviour of both types of yields, when the energy of impinging electrons or the film thickness are changed, can be understood in terms of...

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Bibliographic Details
Published in:Surface science 1985-11, Vol.163 (1), p.266-272
Main Authors: Ferrón, J., De Bernárdez, L.S., Goldberg, E.C., Buitrago, R.H.
Format: Article
Language:English
Subjects:
Condensed matter: structure, mechanical and thermal properties
Cross-disciplinary physics: materials science
rheology
Exact sciences and technology
Materials science
Metals, semimetals and alloys
Physics
Specific materials
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Thin film structure and morphology
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Summary:We have studied, using a Monte Carlo simulation code, the effect of elastic scattering on reflected and transmitted Al thin film Auger yields. We found that the behaviour of both types of yields, when the energy of impinging electrons or the film thickness are changed, can be understood in terms of the slowing down and the elastic scattering of impinging electrons. We have also found that, when working with thin film, and under certain conditions, the backscattering effect may be neglected.
ISSN:0039-6028
1879-2758
DOI:10.1016/0039-6028(85)90863-5