X-ray diffraction from rough, relaxed and reconstructed surfaces

A general formalism is presented for computing the scattered X-ray intensity from surfaces showing disorder in the form of atomic-scale roughness or in the form of reconstructed domains of finite size. Special attention is paid to the interference between bulk and surface contributions, since this i...

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Bibliographic Details
Published in:Surface science 1989-03, Vol.210 (3), p.301-321
Main Authors: Vlieg, E., Van Der Veen, J.F., Gurman, S.J., Norris, C., Macdonald, J.E.
Format: Article
Language:English
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Summary:A general formalism is presented for computing the scattered X-ray intensity from surfaces showing disorder in the form of atomic-scale roughness or in the form of reconstructed domains of finite size. Special attention is paid to the interference between bulk and surface contributions, since this is important in the determination of relaxation parameters or of the registry of a surface unit cell.
ISSN:0039-6028
1879-2758
DOI:10.1016/0039-6028(89)90598-0