Measurement of conversion temperatures for Si(111) 2 × 1

Vacuum cleaved Si(111) surfaces were heated in a miniature furnace to avoid thermal gradients, and the surface temperature was accurately measured with an infrared pyrometer. The results of three cleavages at room temperature, and cleavages at 250, 357 and 486°C, indicate loss of the half order low...

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Bibliographic Details
Published in:Surface science 1989-12, Vol.224 (1), p.L965-L968
Main Authors: Haneman, D., Rownd, J.J., Lagally, M.G.
Format: Article
Language:English
Subjects:
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Physics
Solid surfaces and solid-solid interfaces
Surface structure and topography
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
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Summary:Vacuum cleaved Si(111) surfaces were heated in a miniature furnace to avoid thermal gradients, and the surface temperature was accurately measured with an infrared pyrometer. The results of three cleavages at room temperature, and cleavages at 250, 357 and 486°C, indicate loss of the half order low energy electron diffraction beams under short term heating between 350 and 400°C, with no immediate new fractional order beams. In one case a 5 × 5 structure was found by higher temperature heating. There is an apparent initial conversion to 1 × 1.
ISSN:0039-6028
1879-2758
DOI:10.1016/0039-6028(89)90891-1