A low-energy electron microscopy study of the system Si(111)Au

The system Si(111)Au is studied in the submonolayer range between about 550 and 1100 K by low-energy electron microscopy (LEEM) in situ in real time with the goal to understand the microscopic aspects of the film formation and of the phase transitions of the various phases ((5 × 1), (√3 × √3) R30°...

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Bibliographic Details
Published in:Surface science 1991-08, Vol.253 (1), p.283-296
Main Authors: Świȩch, W., Bauer, E., Mundschau, M.
Format: Article
Language:English
Subjects:
Applied sciences
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Metals. Metallurgy
Physics
Solid surfaces and solid-solid interfaces
Surface and interface dynamics and vibrations
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Thin film structure and morphology
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Summary:The system Si(111)Au is studied in the submonolayer range between about 550 and 1100 K by low-energy electron microscopy (LEEM) in situ in real time with the goal to understand the microscopic aspects of the film formation and of the phase transitions of the various phases ((5 × 1), (√3 × √3) R30° and (6 × 6)) found in this system at elevated temperatures.
ISSN:0039-6028
1879-2758
DOI:10.1016/0039-6028(91)90599-N