Measurement of strain coefficient of resistance in silver films

Epitaxial silver films (300–1400 Å) have been vacuum deposited onto mica substrates in order to assess the effect of strain on resistivity. The experimental procedure for determining the strain coefficient of resistance 1/ R(d R/dε) is described in detail. The results for 1/ R(d R/dε) have been comp...

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Bibliographic Details
Published in:Thin solid films 1971-01, Vol.7 (3), p.259-264
Main Author: Verma, B.S.
Format: Article
Language:English
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Summary:Epitaxial silver films (300–1400 Å) have been vacuum deposited onto mica substrates in order to assess the effect of strain on resistivity. The experimental procedure for determining the strain coefficient of resistance 1/ R(d R/dε) is described in detail. The results for 1/ R(d R/dε) have been compared with those derived from Sondheimer's theory of thin film conduction. It is concluded that the experimental values for 1/ R(d R/dε) show qualitative agreement with this theory.
ISSN:0040-6090
1879-2731
DOI:10.1016/0040-6090(71)90072-1