Charge carrier drift mobility in polycrystalline tetracene layers

The charge carrier drift mobility in tetracene layers was measured using the time-of-flight method. Free carriers were generated by short electron pulses. At electric fields E > 2 × 10 4V cm −1 the drift velocity of holes is constant, i.e. the drift mobility is proportional to the reciprocal elec...

Full description

Saved in:
Bibliographic Details
Published in:Thin solid films 1978-01, Vol.48 (2), p.133-136
Main Authors: Mycielski, W., Lipiński, A.
Format: Article
Language:English
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The charge carrier drift mobility in tetracene layers was measured using the time-of-flight method. Free carriers were generated by short electron pulses. At electric fields E > 2 × 10 4V cm −1 the drift velocity of holes is constant, i.e. the drift mobility is proportional to the reciprocal electric field: μ h ∝ E −1.
ISSN:0040-6090
1879-2731
DOI:10.1016/0040-6090(78)90235-3