Transient currents in copper phthalocyanine layers

The results of the drift mobility experiments for evaporated copper phthalocyanine layers are presented. The transient currents were induced by a short electron pulse and both electron and hole transport were observed. In some cases (for semidispersive pulses) the hole drift mobility which was of th...

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Bibliographic Details
Published in:Thin solid films 1982-01, Vol.91 (4), p.335-338
Main Authors: Mycielski, W., Ziółkowska, B., Lipiński, A.
Format: Article
Language:English
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Summary:The results of the drift mobility experiments for evaporated copper phthalocyanine layers are presented. The transient currents were induced by a short electron pulse and both electron and hole transport were observed. In some cases (for semidispersive pulses) the hole drift mobility which was of the order of 10 -4 cm 2 V -1 s -1 was determined using a “classical” time-of-flight method. Similar values for the hole and electron mobilities were found from completely dispersive transient current pulses using a procedure proposed by Scher and Montroll. The disorder parameter was found to be dependent on the applied field.
ISSN:0040-6090
1879-2731
DOI:10.1016/0040-6090(82)90256-5