An improved method for the determination of the extinction coefficient of thin film materials

The determination of the extinction coefficient of a material deposited in thin film form is generally made from Wolter's formula using (R − R′) T . To avoid the measurement of R′, we have derived an analogous formula involving only R and T in the term (1 − R − T) T . Moreover this new expressi...

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Bibliographic Details
Published in:Thin solid films 1983-01, Vol.102 (3), p.209-220
Main Authors: Borgogno, J.P., Lazarides, B., Roche, P.
Format: Article
Language:English
Subjects:
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Exact sciences and technology
Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation
Optical properties of specific thin films
Physics
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Summary:The determination of the extinction coefficient of a material deposited in thin film form is generally made from Wolter's formula using (R − R′) T . To avoid the measurement of R′, we have derived an analogous formula involving only R and T in the term (1 − R − T) T . Moreover this new expression can be used in oblique incidence.
ISSN:0040-6090
1879-2731
DOI:10.1016/0040-6090(83)90088-3