An iterative and consistent method for the complex refraction index calculation of absorbent thin films

We propose a new, fast and simple method for the calculation of the complex refraction index n+ ik for absorbent thin films on transparent substrates. Given the film thickness and the wavelength of the radiation used, we make use of an iterative-consistent scheme where only the experimental values o...

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Bibliographic Details
Published in:Thin solid films 1989-09, Vol.176 (1), p.69-72
Main Authors: García-Castañeda, Mauricio, Sánchez-Machet, Hernan
Format: Article
Language:English
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Summary:We propose a new, fast and simple method for the calculation of the complex refraction index n+ ik for absorbent thin films on transparent substrates. Given the film thickness and the wavelength of the radiation used, we make use of an iterative-consistent scheme where only the experimental values of the transmittance and reflectance at normal incidence are required. We compare our method with previous calculations, and then apply it for amorphous silicon thin film.
ISSN:0040-6090
1879-2731
DOI:10.1016/0040-6090(89)90364-7