Misfit dislocations in annealed Si1−xGex/Si heterostructures

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Bibliographic Details
Published in:Thin solid films 1989-12, Vol.183 (1-2), p.133-139
Main Authors: Tuppen, C.G., Gibbings, C.J.
Format: Article
Language:English
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ISSN:0040-6090
DOI:10.1016/0040-6090(89)90438-0