Characterization of Langmuir-Blodgett overlayers by time-of-flight secondary ion mass spectrometry

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) in combination with ion imaging (lateral resolution 1 μm) has been applied to the analysis and characterization of Langmuir-Blodgett (LB) films. Silver, evaporated onto polycarbonate slices, was used as substrate material. Whereas films made...

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Bibliographic Details
Published in:Thin solid films 1992-04, Vol.210, p.601-605
Main Authors: Hagenhoff, Birgit, Benninghoven, Alfred, Siegmund, Hans-Ulrich, Holtkamp, Dieter
Format: Article
Language:English
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Summary:Time-of-flight secondary ion mass spectrometry (TOF-SIMS) in combination with ion imaging (lateral resolution 1 μm) has been applied to the analysis and characterization of Langmuir-Blodgett (LB) films. Silver, evaporated onto polycarbonate slices, was used as substrate material. Whereas films made from monomeric amphiphiles show defect structures of a diameter less than 1 μm, polymeric amphiphiles were found to form closed and homogeneous layers. Binary mixtures consisting of monomeric species in a polymeric matrix show a vertical diffusion of the monomeric component towards the surface. An additional application of imaging TOF-SIMS is demonstrated by the localization of contaminants.
ISSN:0040-6090
1879-2731
DOI:10.1016/0040-6090(92)90352-C