X-ray, reflection high electron energy diffraction and X-ray photoelectron spectroscopy studies of InSe and γ-In2Se3 thin films grown by molecular beam deposition

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Bibliographic Details
Published in:Thin solid films 1994, Vol.237 (1-2), p.291-296
Main Authors: BRAHIM-OTSMANE, L, EMERY, J.-Y, EDDRIEF, M
Format: Article
Language:English
Subjects:
Cross-disciplinary physics: materials science
rheology
Exact sciences and technology
Materials science
Methods of deposition of films and coatings
film growth and epitaxy
Molecular, atomic, ion, and chemical beam epitaxy
Physics
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ISSN:0040-6090
1879-2731
DOI:10.1016/0040-6090(94)90275-5