Evaluation of the distribution coefficient of silicon in cadmium using radioactive tracers

Irradiated silicon was dissolved in molten cadmium and gradually solidified. The distribution of radioactive 31Si along the Cd rod was determined by β counting. The distribution coefficient of Si in Cd was found to be 1.9 ± 0.2.

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Bibliographic Details
Published in:Materials letters 1985-01, Vol.3 (9), p.379-380
Main Authors: Feldstein, H., Aharonovitz, R., Even, O.
Format: Article
Language:English
Subjects:
Condensed matter: structure, mechanical and thermal properties
Cross-disciplinary physics: materials science
rheology
Defects and impurities in crystals
microstructure
Exact sciences and technology
Impurities: concentration, distribution, and gradients
Materials science
Metals, semimetals and alloys
Physics
Specific materials
Structure of solids and liquids
crystallography
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Description
Summary:Irradiated silicon was dissolved in molten cadmium and gradually solidified. The distribution of radioactive 31Si along the Cd rod was determined by β counting. The distribution coefficient of Si in Cd was found to be 1.9 ± 0.2.
ISSN:0167-577X
1873-4979
DOI:10.1016/0167-577X(85)90081-3