Considerations of surface structure characterization for polyethylene films by reflectometry

Several polyethylene film surfaces were examined by the reflectometry technique by using different incidence angles of light. A logarithmic relationship has been found between the measured reflectometrical values using different incident angles.

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Bibliographic Details
Published in:Materials letters 1990-10, Vol.10 (3), p.136-138
Main Authors: Larena, Alicia, Pinto, Gabriel
Format: Article
Language:English
Subjects:
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Physics
Solid surfaces and solid-solid interfaces
Surface structure and topography
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
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Description
Summary:Several polyethylene film surfaces were examined by the reflectometry technique by using different incidence angles of light. A logarithmic relationship has been found between the measured reflectometrical values using different incident angles.
ISSN:0167-577X
1873-4979
DOI:10.1016/0167-577X(90)90047-P