Micro-PIXE measurement of nickel distribution in supported nickel oxide catalyst

Microbeam PIXE technique was used to measure nickel distribution on individual silica particles, 60–200 μm in sizes, in nickel oxide catalysts supported on a silica base. A 2.5 MeV scanning proton microbeam of about 5 μm resolution was used. The catalysts were synthesized with 1% and 5% nickel loadi...

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Bibliographic Details
Published in:Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Beam interactions with materials and atoms, 1995-10, Vol.103 (2), p.233-235
Main Authors: Ahmed, M., Rahman, A., Nickel, J., Garwan, M.A.
Format: Article
Language:English
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Summary:Microbeam PIXE technique was used to measure nickel distribution on individual silica particles, 60–200 μm in sizes, in nickel oxide catalysts supported on a silica base. A 2.5 MeV scanning proton microbeam of about 5 μm resolution was used. The catalysts were synthesized with 1% and 5% nickel loadings and then calcined at 400°C. Effects of the nickel loadings and the calcination treatment on the nickel distribution were studied.
ISSN:0168-583X
1872-9584
DOI:10.1016/0168-583X(95)00593-5