Importance of matrix changes in PIXE elemental analysis

In PIXE (Particle Induced X-ray Emission) trace-element analysis of thick targets, especially the biological ones, one has to consider matrix effects as well as possible matrix changes during beam irradiation. Such phenomena have been investigated and matrix effects in determination of trace element...

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Published in:Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Beam interactions with materials and atoms, 1996-07, Vol.114 (3), p.345-349
Main Authors: Kwiatek, Wojciech M., Lekki, Janusz, Dutkiewicz, Erazm M., Paluszkiewicz, Czesława
Format: Article
Language:English
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Summary:In PIXE (Particle Induced X-ray Emission) trace-element analysis of thick targets, especially the biological ones, one has to consider matrix effects as well as possible matrix changes during beam irradiation. Such phenomena have been investigated and matrix effects in determination of trace element concentration have been taken into account in a procedure based on the use of FTIR (Fourier Transform InfraRed) and EBS (Elastic Back Scattering) methods as complementary techniques for PIXE experiments. FTIR gives a rough estimation of sample chemical composition while EBS is used for the determination of the proper composition of major elements that form the sample matrix. This information is a base for calculations with the use of principal formula for the detected X-ray yields. In this paper two examples of the matrix change effects as well as the applications of the experimental and computational procedure are shown.
ISSN:0168-583X
1872-9584
DOI:10.1016/0168-583X(96)00203-0