A high resolution magnetic spectrograph for ion beam analysis

A magnetic spectrograph especially designed for interface and thin film analysis has been installed at the 6.5 MV tandem accelerator of the University of Utrecht. It is provided with a Wien filter, so that both the mass and the charge of the ions arriving in the focal plane is determined. In the foc...

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Bibliographic Details
Published in:Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Beam interactions with materials and atoms, 1996-09, Vol.118 (1), p.566-572
Main Authors: Arnoldbik, W.M., Wolfswinkel, W., Inia, D.K., Verleun, V.C.G., Lobner, S., Reinders, J.A., Labohm, F., Boerma, D.O.
Format: Article
Language:English
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Summary:A magnetic spectrograph especially designed for interface and thin film analysis has been installed at the 6.5 MV tandem accelerator of the University of Utrecht. It is provided with a Wien filter, so that both the mass and the charge of the ions arriving in the focal plane is determined. In the focal plane a two-dimensional position-sensitive detector is used to obtain spectra with resolved energy along one axis, and resolved angles (perpendicular to the scattering plane) along the other axis. A special bellows construction allows the spectrograph to be rotated over an angular range of 120° while maintaining the ultra-high vacuum conditions. The first results of RBS and ERD measurements are presented.
ISSN:0168-583X
1872-9584
DOI:10.1016/0168-583X(96)00259-5