The influence of proximity effect on the quasiparticle collection

Results from a comparison between current-voltage data measured on Nb/Al/AlO x /Al/Nb tunneling junctions to a proximity effect model proposed by Golubov et al. [J. Low Temp. Phys. 70 (1988) 83] are used to get an estimation of the quasiparticle collection as a function of the Al-film thickness (4 a...

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Bibliographic Details
Published in:Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Accelerators, spectrometers, detectors and associated equipment, 1996-02, Vol.370 (1), p.117-118
Main Authors: Finkbeiner, F, Nussbaumer, Th, Lerch, Ph, Zehnder, A, Ott, H.R
Format: Article
Language:English
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Summary:Results from a comparison between current-voltage data measured on Nb/Al/AlO x /Al/Nb tunneling junctions to a proximity effect model proposed by Golubov et al. [J. Low Temp. Phys. 70 (1988) 83] are used to get an estimation of the quasiparticle collection as a function of the Al-film thickness (4 and 120 nm) in X-ray detectors.
ISSN:0168-9002
1872-9576
DOI:10.1016/0168-9002(95)01110-2