Energy straggling and multiple scattering in silicon strip detectors

We present a test beam study of energy straggling and multiple scattering in silicon strip detectors using electrons and pions of momenta up to 50 GeV. Results are compared with GEANT simulation using a simple algorithm to parameterize energy loss distribution. The deflection due to multiple scatter...

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Bibliographic Details
Published in:Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Accelerators, spectrometers, detectors and associated equipment, 1996-06, Vol.374 (3), p.309-314
Main Authors: Antičić, T, Battiston, R, Braunschweig, W, Chang, Y.H, Chien, C.-Y, Chen, A.E, Hou, S.R, Lin, C.H, Lin, W.T, Ostonen, R, Spartiotis, K, Syben, O, Toker, O, Wittmer, B
Format: Article
Language:English
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Summary:We present a test beam study of energy straggling and multiple scattering in silicon strip detectors using electrons and pions of momenta up to 50 GeV. Results are compared with GEANT simulation using a simple algorithm to parameterize energy loss distribution. The deflection due to multiple scattering in crystalline structure was investigated by placing a GaAs wafer at various angles.
ISSN:0168-9002
1872-9576
DOI:10.1016/0168-9002(96)00272-0